Do you regularly need to test power sources with high dynamics? Perhaps you need a versatile DC electronic load to cover all your research requirements? Our new generation of high current modular power recycling loads offer the perfect solution. The modules are ideal for high current applications such as testing mild hybrid components, magnet PSUs and running short-circuit tests.
The G5-REGEN-HC features the ability to implement a programmable ripple, allowing an AC ripple on a DC battery link to be recreated. By utilising the embedded function generator the user can set a current ripple at up to 10kHz. The magnitude can be up to 5% of the nominal system current. Depending on the impedance of the DUT the resulting voltage ripple can be calculated.
G5-REGEN-HC: Key Features
- Sink currents up to 2028A per module/89kA per system
- Two current ranges for high accuracy
- Programmable ripple to 10kHz
- Ultra-fast dynamic behaviour
- Mixed power nominals in master-slave
A current step between 0% to 90% sinking current can be as quick as 50μs. Switchable output capacitance is also provided to improve stability when operating in constant voltage mode. This is particularly useful to assist the fast current demands when testing high speed electric drives, as some DUTs will be damaged if the voltage drops too low.
Modules can be arranged in series, parallel or matrix configurations. Sink voltages up to 1280V are possible in a centre tapped earth arrangement. The modular approach is useful for test houses and research labs who regularly test different sized power devices. Individual modules can be used for the day to day testing of multiple small devices, then grouped together for larger projects.
Each unit has an extensive feature set which includes programmable PID parameters and an inbuilt 8 channel recording scope. Adjustable power and resistance limits are provided, as well as a selection of remote control options including high-speed CAN. An intuitive operating GUI is standard which provides a variety of programming features and second level parameters, useful for optimising test processes.